TransfermaticEM at San Joaquin Delta College

    E M 86M - Focused Ion Beam Applications

    Recent Professors
    Not yet assigned
    Recent Semesters
    No scheduled sections on record
    Class Size
    Not published
    Credits
    4
    Prerequisite
    E M 74 Scanning Electron Microscopy with a grade of "C" or better.
    Transfers To
    Not transferable
    Description
    This course is an advanced microscopy lecture and laboratory course specifically dealing with the alignment and operation of the focused ion beam (FIB) instrument which covers basic and advanced operations applications. This course cover single beam, dual beam, triple beam and Plasma Beam Operations with STEM applications through EZ-lift capabilities. Back to Top | Print-Friendly Page (opens a new window) Facebook this Page (opens a new window) Tweet this Page (opens a new window) Add to Favorites (opens a new window) All catalogs © 2026 San Joaquin Delta College. Powered by Modern Campus Catalog™ .